#5975
Some of the targets with 32K RAM seems to be failing the heap block device tests
Suggested enhancement
Can the tests be modified to use less heap on resource constrained devices?
Pros
How to?
Is there an option to include something like "special, low memory" tests that could may be selected based on a macro (similar to that being done for SD driver tests now) and built / ran only for a few selected targets?
@geky @theotherjimmy @cmonr @0xc0170 .. this issue is for tracking the specific test changes made for xDOT as part of https://github.com/ARMmbed/mbed-os/pull/5975 ..
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Is there an option to include something like "special, low memory" tests that could may be selected based on a macro (similar to that being done for SD driver tests now) and built / ran only for a few selected targets?
This sounds like something that @ARMmbed/mbed-os-storage just brought in.
[Mirrored to Jira]
This sounds like something that @ARMmbed/mbed-os-storage just brought in.
Indeed. #7465 handles it.
[Mirrored to Jira]
Internal Jira reference: https://jira.arm.com/browse/IOTSTOR-454
Most helpful comment
Indeed. #7465 handles it.
[Mirrored to Jira]