Mbed-os: NRF51_DK - AnalogIn, PWM, Concurrent GPIO failures (CI test shield)
Description
- Type: Bug
- Priority: Minor
Bug
Target
NRF51_DK
Toolchain:
GCC_ARM
Toolchain version:
6
mbed-cli version:
1.2.0
mbed-os sha:
Current master https://github.com/ARMmbed/mbed-os/#0906be6397c984026df180b07a3bbd965af52346
Expected behavior
All tests should pass.
Actual behavior
+------------------+---------------+-----------------------------+------------------------------------------------------------------------+--------+--------+--------+--------------------+
| target | platform_name | test suite | test case | passed | failed | result | elapsed_time (sec) |
+------------------+---------------+-----------------------------+------------------------------------------------------------------------+--------+--------+--------+--------------------+
| NRF51_DK-GCC_ARM | NRF51_DK | tests-api-analogin | Analog Input on AIN_0 | 0 | 2 | FAIL | 0.27 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-api-analogin | Analog Input on AIN_1 | 0 | 2 | FAIL | 0.27 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-api-analogin | Analog Input on AIN_2 | 0 | 2 | FAIL | 0.28 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-api-analogin | Analog Input on AIN_3 | 0 | 2 | FAIL | 0.28 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-api-analogin | Analog Input on AIN_4 | 0 | 2 | FAIL | 0.27 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-api-analogin | Analog Input on AIN_5 | 0 | 2 | FAIL | 0.27 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-api-pwm_fall | PWM_0 Frequency 30ms | 0 | 0 | ERROR | 0.0 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-api-pwm_rise | PWM_0 Frequency 30ms | 0 | 0 | ERROR | 0.0 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-api-pwm_rise_fall | PWM_0 Frequency 10ms | 0 | 0 | ERROR | 0.0 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-concurrent-comms | Concurrent testing of I2C and SPI in a single thread | 0 | 3 | FAIL | 5.61 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-concurrent-comms | Concurrent testing of I2C and SPI in multiple threads | 0 | 0 | ERROR | 0.0 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-concurrent-gpio | Concurrent testing of DIO(D2,D3), AnalogIn(A0), and InterruptIn(D4,D5) | 0 | 2 | FAIL | 0.19 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-concurrent-gpio | Concurrent testing of DIO(D3,D2), AnalogIn(A1), and InterruptIn(D5,D4) | 0 | 2 | FAIL | 0.2 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-concurrent-gpio | Concurrent testing of DIO(D4,D5), AnalogIn(A2), and InterruptIn(D6,D7) | 0 | 2 | FAIL | 0.19 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-concurrent-gpio | Concurrent testing of DIO(D5,D4), AnalogIn(A3), and InterruptIn(D7,D6) | 0 | 12 | FAIL | 0.79 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-concurrent-gpio | Concurrent testing of DIO(D6,D7), AnalogIn(A4), and InterruptIn(D8,D9) | 0 | 12 | FAIL | 0.78 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-concurrent-gpio | Concurrent testing of DIO(D7,D6), AnalogIn(A5), and InterruptIn(D9,D8) | 0 | 12 | FAIL | 0.78 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-concurrent-gpio | Concurrent testing of DIO(D8,D9), AnalogIn(A5), and InterruptIn(D2,D3) | 0 | 2 | FAIL | 0.2 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-concurrent-gpio | Concurrent testing of DIO(D9,D8), AnalogIn(A5), and InterruptIn(D3,D2) | 0 | 12 | FAIL | 0.79 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-concurrent-mixed | Concurrent testing of Comms and GPIO in a single thread | 0 | 3 | FAIL | 19.25 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-concurrent-mixed | Concurrent testing of Comms and GPIO in multiple threads | 0 | 0 | ERROR | 0.0 |
+------------------+---------------+-----------------------------+------------------------------------------------------------------------+--------+--------+--------+--------------------+
mbedgt: completed in 1020.51 sec
mbedgt: exited with code 8
Steps to reproduce
Run the application at https://github.com/ARMmbed/ci-test-shield
i.e.
$ git clone https://github.com/ARMmbed/ci-test-shield.git && cd ci-test-shield
Set mbed-os version in mbed-os.lib
$ mbed deploy
$ mbed target auto
$ mbed toolchain GCC_ARM
$ mbed test -n tests-* --app-config .\mbed_app.json
ghost
All 20 comments
The NRF51 DK is not Arduino compatible out of the box, it requires some hardware rework as indicated in the user guide.
Unfortunately, there's no way to completely disable Buttons (mapped from D5 to D9). That might explains some of the issues you are experiencing.
[Mirrored to Jira]
pan-
on 19 Sep 2017
Unfortunately, there's no way to completely disable Buttons (mapped from D5 to D9). That might explains some of the issues you are experiencing.
@nvlsianpu @anangl Can you confirm that the issues above are known and expected?
[Mirrored to Jira]
0xc0170
on 19 Sep 2017
Analog part was failing because input voltage range is set to 0-1.2 V, which causes input saturation. I will extend this to 3.6 V using build in analog prescaler.
[Mirrored to Jira]
nvlsianpu
on 26 Sep 2017
@nvlsianpu Could you comment about the buttons ?
[Mirrored to Jira]
pan-
on 26 Sep 2017
I'm investigating this.
[Mirrored to Jira]
nvlsianpu
on 26 Sep 2017
This is all software related bugs - two patches for fix them are pending.
[Mirrored to Jira]
nvlsianpu
on 27 Sep 2017
Thanks, I ran this again with the latest mbed-os and got the following results
+------------------+---------------+-----------------------------+------------------------------------------------------------------------+--------+--------+--------+--------------------+
| target | platform_name | test suite | test case | passed | failed | result | elapsed_time (sec) |
+------------------+---------------+-----------------------------+------------------------------------------------------------------------+--------+--------+--------+--------------------+
| NRF51_DK-GCC_ARM | NRF51_DK | tests-api-pwm_fall | PWM_0 Frequency 30ms | 0 | 0 | ERROR | 0.0 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-api-pwm_rise | PWM_0 Frequency 30ms | 0 | 0 | ERROR | 0.0 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-api-pwm_rise_fall | PWM_0 Frequency 10ms | 0 | 0 | ERROR | 0.0 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-concurrent-comms | Concurrent testing of I2C and SPI in a single thread | 0 | 3 | FAIL | 5.61 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-concurrent-comms | Concurrent testing of I2C and SPI in multiple threads | 0 | 0 | ERROR | 0.0 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-concurrent-mixed | Concurrent testing of Comms and GPIO in a single thread | 0 | 3 | FAIL | 19.28 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-concurrent-mixed | Concurrent testing of Comms and GPIO in multiple threads | 0 | 0 | ERROR | 0.0 |
+------------------+---------------+-----------------------------+------------------------------------------------------------------------+--------+--------+--------+--------------------+
[Mirrored to Jira]
ghost
on 10 Oct 2017
@ARMmbed/team-nordic Could you look at the remaining issues ?
[Mirrored to Jira]
pan-
on 10 Oct 2017
The Nordic SDK team is very busy with an imminent SDK release. A lot of extra activities have been put on hold, as we are going out with a whole new architecture of our chips. We will look at this as soon as we can, but it may take some time.
[Mirrored to Jira]
frkv
on 10 Oct 2017
@scartmell-arm And what were results for NRF52_DK? Didn't they pass?
For sure I'm in progress of the bug searching.
[Mirrored to Jira]
nvlsianpu
on 10 Oct 2017
looks like after my last update to SPI wchih was on rev c2951877509fcdd8b8152bf78379a14d6f4726c9. For this spi tests had passed .After this some changes corrupteds spi - still not sure which one.
[Mirrored to Jira]
nvlsianpu
on 10 Oct 2017
tests-api-spi failing since rev cb4e9b32a2933553630ff1ed40f9bdb77e51fda2 Sleep HAL: add sleep manager API
[Mirrored to Jira]
nvlsianpu
on 10 Oct 2017
@0xc0170 any thoughts?
[Mirrored to Jira]
nvlsianpu
on 10 Oct 2017
@scartmell-arm And what were results for NRF52_DK? Didn't they pass?
I didn't have one when I did the testing, but have since located one. I reran the test for both boards. (I'm not sure why the results are different for NRF51 this time).
NRF51_DK
+------------------+---------------+-----------------------------+------------------------------------------------------------------------+--------+--------+--------+--------------------+
| target | platform_name | test suite | test case | passed | failed | result | elapsed_time (sec) |
+------------------+---------------+-----------------------------+------------------------------------------------------------------------+--------+--------+--------+--------------------+
| NRF51_DK-GCC_ARM | NRF51_DK | tests-api-pwm_fall | PWM_0 Frequency 30ms | 0 | 0 | ERROR | 0.0 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-api-pwm_rise | PWM_0 Frequency 30ms | 0 | 0 | ERROR | 0.0 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-api-pwm_rise_fall | PWM_0 Frequency 10ms | 0 | 0 | ERROR | 0.0 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-concurrent-comms | Concurrent testing of I2C and SPI in multiple threads | 0 | 0 | ERROR | 0.0 |
| NRF51_DK-GCC_ARM | NRF51_DK | tests-concurrent-mixed | Concurrent testing of Comms and GPIO in multiple threads | 0 | 0 | ERROR | 0.0 |
+------------------+---------------+-----------------------------+------------------------------------------------------------------------+--------+--------+--------+--------------------+
NRF52_DK
+------------------+---------------+-----------------------------+-----------------------------+--------+--------+--------+--------------------+
| target | platform_name | test suite | test case | passed | failed | result | elapsed_time (sec) |
+------------------+---------------+-----------------------------+-----------------------------+--------+--------+--------+--------------------+
| NRF52_DK-GCC_ARM | NRF52_DK | tests-api-analogin | tests-api-analogin | 0 | 1 | ERROR | 125.82 |
| NRF52_DK-GCC_ARM | NRF52_DK | tests-api-businout | tests-api-businout | 0 | 1 | ERROR | 125.77 |
| NRF52_DK-GCC_ARM | NRF52_DK | tests-api-digitalio | tests-api-digitalio | 0 | 1 | ERROR | 125.76 |
| NRF52_DK-GCC_ARM | NRF52_DK | tests-api-i2c | tests-api-i2c | 0 | 1 | ERROR | 125.8 |
| NRF52_DK-GCC_ARM | NRF52_DK | tests-api-interruptin | tests-api-interruptin | 0 | 1 | ERROR | 125.9 |
| NRF52_DK-GCC_ARM | NRF52_DK | tests-api-pwm_fall | tests-api-pwm_fall | 0 | 1 | ERROR | 125.94 |
| NRF52_DK-GCC_ARM | NRF52_DK | tests-api-pwm_rise | tests-api-pwm_rise | 0 | 1 | ERROR | 125.87 |
| NRF52_DK-GCC_ARM | NRF52_DK | tests-api-pwm_rise_fall | tests-api-pwm_rise_fall | 0 | 1 | ERROR | 125.83 |
| NRF52_DK-GCC_ARM | NRF52_DK | tests-api-spi | tests-api-spi | 0 | 1 | ERROR | 126.03 |
| NRF52_DK-GCC_ARM | NRF52_DK | tests-assumptions-analogin | tests-assumptions-analogin | 0 | 1 | ERROR | 125.87 |
| NRF52_DK-GCC_ARM | NRF52_DK | tests-assumptions-digitalio | tests-assumptions-digitalio | 0 | 1 | ERROR | 126.1 |
| NRF52_DK-GCC_ARM | NRF52_DK | tests-assumptions-i2c | tests-assumptions-i2c | 0 | 1 | ERROR | 125.73 |
| NRF52_DK-GCC_ARM | NRF52_DK | tests-assumptions-pwm | tests-assumptions-pwm | 0 | 1 | ERROR | 125.9 |
| NRF52_DK-GCC_ARM | NRF52_DK | tests-assumptions-pwmout | tests-assumptions-pwmout | 0 | 1 | ERROR | 107.13 |
| NRF52_DK-GCC_ARM | NRF52_DK | tests-assumptions-spi | tests-assumptions-spi | 0 | 1 | ERROR | 19.09 |
| NRF52_DK-GCC_ARM | NRF52_DK | tests-concurrent-comms | tests-concurrent-comms | 0 | 1 | ERROR | 125.94 |
| NRF52_DK-GCC_ARM | NRF52_DK | tests-concurrent-gpio | tests-concurrent-gpio | 0 | 1 | ERROR | 125.76 |
| NRF52_DK-GCC_ARM | NRF52_DK | tests-concurrent-mixed | tests-concurrent-mixed | 0 | 1 | ERROR | 126.1 |
+------------------+---------------+-----------------------------+-----------------------------+--------+--------+--------+--------------------+
[Mirrored to Jira]
ghost
on 12 Oct 2017
I guess there's either something wrong or I haven't configured my NRF52 properly as I get the same timeout errors both before and after the changeset highlighted in nRF52 SPI had been broken by Add sleep manager API PR #5297 . I'll look into it.
[Mirrored to Jira]
ghost
on 12 Oct 2017
This is what I have on terminal for 'concurrent comms' test for NRF52_DK:
mbedmbedmbedmbedmbedmbedmbedmbed
{{__sync;1a2cdb58-88d8-4c5f-8db4-0d4609576611}}
{{__version;1.3.0}}
{{__timeout;40}}
{{__host_test_name;default_auto}}
>>> Running 2 test cases...
{{__testcase_name;Concurrent testing of I2C and SPI in a single thread}}
{{__testcase_name;Concurrent testing of I2C and SPI in multiple threads}}
>>> Running case #1: 'Concurrent testing of I2C and SPI in a single thread'...
{{__testcase_start;Concurrent testing of I2C and SPI in a single thread}}
{{__testcase_finish;Concurrent testing of I2C and SPI in a single thread;1;0}}
>>> 'Concurrent testing of I2C and SPI in a single thread': 1 passed, 0 failed
>>> Running case #2: 'Concurrent testing of I2C and SPI in multiple threads'...
{{__testcase_start;Concurrent testing of I2C and SPI in multiple threads}}
Operator new[] out of memory
Looks like it is a stack to small issue. @pan- your opinion?
[Mirrored to Jira]
nvlsianpu
on 17 Nov 2017
@pan-, @0xc0170 ^^
[Mirrored to Jira]
nvlsianpu
on 27 Nov 2017
@nvlsianpu Seems you are correct, looking at the code, they use OS_STACK_SIZE for the app, that is very small, and should not be used. Can you send a patch to address this issue?
reference: https://github.com/ARMmbed/ci-test-shield/blob/master/TESTS/concurrent/Comms/Comms.cpp#L40
[Mirrored to Jira]
0xc0170
on 27 Nov 2017
Internal Jira reference: https://jira.arm.com/browse/IOTDEV-1571
adbridge
on 4 Oct 2018
This issue is 18month old. Let me know if it's still an issue.
linlingao
on 29 May 2019
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This is all software related bugs - two patches for fix them are pending.
[Mirrored to Jira]